Reduce inspection times by measuring features simultaneously using dual-column machines or two portable measuring devices.
Dual inspection allows you to measure large parts in a single coordinate system.
If you are using dual-devices, when you have connected and calibrated both devices, you can create and run inspections normally using the devices interchangeably. For example, you can probe some points of an item with one device, and then switch to the other device to complete the measurements. Measurements are reported the same as a single device.
The following example shows the setup required to run PowerInspect in dual-column mode using the I++ connection protocol:
CMM Controller
Computer running I++ Server and
PowerInspect in dual-column mode. The computer must conform to the requirements specified in the
PowerInspect Installation Guide.
Computer running I++ Server
Network connection