To use a Probe & Parameters item in a dual-column inspection sequence

Select the column you want to measure the item with and specify the probe assembly you want to use.

In dual-column mode, Probe and Parameters items work in the same way as in single-column mode except that you must select the measuring column before changing the probe tool.

1. Click Probe Path > Items panel > Probe & Parameters.

   

2. In the Probe & Parameters dialog specify the following:
   • Name.
   • Reference item.

     Set up probe tool — To use a specific probe tool for this item, select this check box and the column on which the probe is located.

     Select an entry in the Probe list. If the probe has multiple tips, select the tip you want to use in the Sensor list.

     The column names are determined by the Device names specified in the CMMDriver Configuration dialog and the Associated machine selections in the Dual Simulator Configuration dialog.

   • Measure head touch.
   • Distances, Speeds, and Accelerations.
3. Click OK to close the dialog and add the item to the inspection sequence.